Transfer length method

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Transfer length method

Dbpedia

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The Transfer Length Method or the "Transmission Line Model" (both abbreviated as TLM) is a technique used in semiconductor physics and engineering to determine the specific contact resistivity between a metal and a semiconductor. TLM has been developed because with the ongoing device shrinkage in microelectronics the relative contribution of the contact resistance at metal-semiconductor interfaces in a device could not be neglected any more and an accurate measurement method for determining the specific contact resistivity was required.

English Wikipedia http://en.wikipedia.org/wiki/Transfer_length_method

Wiki page external link http://tuttle.merc.iastate.edu/ee432/topics/metals/tlm_measurements.pdf